Business NewsPR NewsWire • McBain to Show New Near-Infrared Inspection Systems and Wafer Handling Systems at Semicon West

McBain to Show New Near-Infrared Inspection Systems and Wafer Handling Systems at Semicon West

McBain to Show New Near-Infrared Inspection Systems and Wafer Handling Systems at Semicon West

SIMI VALLEY, Calif., July 2 /PRNewswire/ -- McBain Systems of Simi Valley announced that it will be exhibiting at the Semicon West show in San Francisco later this month. McBain will show its recently introduced near-infrared (NIR) defect detection and review (DDR) stations as well as its automated

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McBain to Show New Near-Infrared Inspection Systems and Wafer Handling Systems at Semicon West